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Selection of Three-Class Attributes Double Sampling Plan Indexed Through Fixed Points on OC Surface

R. Radhakrishnan, S. Ravi Sankar

Abstract


Traditional 2-class sampling plans are used to classify a lot of items as acceptable or nonacceptable by considering only the number of non-conformities found in the sample. These plans do not provide any consideration for marginal defective items. By considering the near miss item as marginal, the 3-class sampling plans are used to take a decision to accept or reject a lot based on not only the number of non-conformities; but also on the number of marginal items. This paper presents procedure for selecting 3-class attributes Double Sampling Plan using Acceptable Quality Level (AQL) or Indifference Quality Level (IQL) or Limiting Quality Level (LQL) as the quality standard and the desired proportion of marginal items. A table is also constructed for easy selection of these plans.

Keywords


Multinomial Distribution, AQL, LQL, IQL, Marginal Quality

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